HOME > 論文 > 書誌詳細Demonstration of low-temperature atomic force microscope with atomic resolution using piezoresistive cantileversIchiro Shiraki, Yutaka Miyatake, Toshihiko Nagamura, Kazushi Miki. Review of Scientific Instruments 77 [2] 023705. 2006.https://doi.org/10.1063/1.2169469 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:55:25 +0900更新時刻: 2024-04-01 20:56:32 +0900
