Electron-beam irradiation of photopolymerized C60 film studied using in situ scanning tunneling microscope, in situ Fourier-transform infrared spectroscopy, and first-principles calculations | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Electron-beam irradiation of photopolymerized C60 film studied using in situ scanning tunneling microscope, in situ Fourier-transform infrared spectroscopy, and first-principles calculations

Jun Onoe, Masato Nakaya, Shinta Watanabe, Tomonobu Nakayama, Kaoru Ohno, Yusuke Noda.

AIP Advances 10 [8] 085212. 2020.

https://doi.org/10.1063/5.0018985

Open Access AIP Publishing (Publisher)

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作成時刻: 2020-09-05 03:00:17 +0900更新時刻: 2024-03-30 23:49:24 +0900

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