HOME > 論文 > 書誌詳細Sputter Depth Profiling og GaAs/AsAl Multilayers:Dependence of the Depth Resolution Parameters on the Profiling Conditions.A.Rar, S.Hofmann, I.Yoshihara, K.Kajiwara. Journal of Scerface Analysis . .NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-11-15 00:39:23 +0900更新時刻: 2022-11-15 00:39:23 +0900
