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RCAMC, In-situ Characterization Technique Development Group: 5 researcher(s) found.
Sorted by the alphabetical order. Displaying from 1 to 5.

HASHIMOTO, Ayako (橋本 綾子)

Principal Researcher, Atomic Strucuture and Physics Field, In-situ Characterization Technique Development Group, Research Center for Advanced Measurement and Characterization

Keywords

ナノ構造材料　電子顕微鏡

MITSUI, Tadashi (三井 正)

Senior Researcher, Atomic Strucuture and Physics Field, In-situ Characterization Technique Development Group, Research Center for Advanced Measurement and Characterization

Keywords

マイクロ・ナノデバイス 応用光学・量子光工学

MITSUISHI, Kazutaka (三石 和貴)

Deputy Director, Research Center for Advanced Measurement and Characterization

Keywords

電子顕微鏡技術、ナノ構造科学 応用物性・結晶工学 無機材料・物性

NIITSU, Kodai (新津 甲大)

Independent Scientist, Research Center for Advanced Measurement and Characterization

TAKEGUCHI, Masaki (竹口 雅樹)

Group Leader, Electron Microscopy Analysis Station, Nanostructural Characterization Group, RNFS

Keywords

電子顕微鏡、電子線ホログラフィー、共焦点STEM、3次元観察