publication_type	publication_year	number	author	title	journal_title	volume_number	issue_number	start_page	end_page	doi	reported_at
Paper	2023	1	Hiroshi Shinotsuka, Kenji Nagata, Malinda Siriwardana, Hideki Yoshikawa, Hayaru Shouno, Masato Okada		Journal of Electron Spectroscopy and Related Phenomena	267		147370		https://doi.org/10.1016/j.elspec.2023.147370	2024-04-19 21:11:04 +0900
Paper	2023	2	Ryo Murakami, Yoshitomo Harada, Yutaka Sonobayashi, Hiroshi Oji, Hisao Makino, Hiromi Tanaka, Hideyuki Taguchi, Takanori Sakamoto, Haruka Morita, Akihiko Wakamori, Naoko Kibe, Shinsuke Nishida, Kenji Nagata, Hiroshi Shinotsuka, Hayaru Shouno, Hideki Yoshikawa		Journal of Electron Spectroscopy and Related Phenomena	264		147298		https://doi.org/10.1016/j.elspec.2023.147298	2024-04-19 21:11:04 +0900
Paper	2022	1	Ryo Murakami, Hideki Yoshikawa, Kenji Nagata, Hiroshi Shinotsuka, Hiromi Tanaka, Takeshi Iizuka, Hayaru Shouno	Automatic estimation of unknown chemical components in a mixed material by XPS analysis using a genetic algorithm	Science and Technology of Advanced Materials: Methods	2	1	91	105	https://doi.org/10.1080/27660400.2022.2061878	2024-04-19 21:11:04 +0900
Paper	2022	2	B. Da, X. Liu, L. H. Yang, J. M. Gong, Z. J. Ding, H. Shinotsuka, J. W. Liu, H. Yoshikawa, S. Tanuma		Journal of Applied Physics	131	17			https://doi.org/10.1063/5.0085984	2024-04-19 21:11:04 +0900
Paper	2022	3	Hiroshi Shinotsuka, Shigeo Tanuma, Cedric J. Powell		Surface and Interface Analysis	54	5	534	560	https://doi.org/10.1002/sia.7064	2024-04-19 21:11:04 +0900
Paper	2022	4	篠塚 寛志	ベイズ情報量規準をベースとしたXPSスペクトルの全自動解析システムの進展	表面と真空	65	3	121	127	https://doi.org/10.1380/vss.65.121	2024-04-19 21:11:04 +0900
Paper	2021	1	Hiroshi Shinotsuka, Hideki Yoshikawa, Shigeo Tanuma	First-principles Calculations of Optical Energy Loss Functions for 30 Compound and 5 Elemental Semiconductors	e-Journal of Surface Science and Nanotechnology	19	0	70	87	https://doi.org/10.1380/ejssnt.2021.70	2024-04-19 21:11:04 +0900
Paper	2021	2	Atsushi Machida, Kenji Nagata, Ryo Murakami, Hiroshi Shinotsuka, Hayaru Shouno, Hideki Yoshikawa, Masato Okada		Science and Technology of Advanced Materials: Methods	1	1	123	133	https://doi.org/10.1080/27660400.2021.1943172	2024-04-19 21:11:04 +0900
Paper	2021	3	Ryo Murakami, Hayaru Shouno, Kenji Nagata, Hiroshi Shinotsuka, Hideki Yoshikawa	Determination of common peak structure from multiple X-ray photo-electron spectroscopy data sets	Science and Technology of Advanced Materials: Methods	1	1	182	191	https://doi.org/10.1080/27660400.2021.1957304	2024-04-19 21:11:04 +0900
Paper	2020	1	Ryo Murakami, Kazuki Nakamura, Hiromi Tanaka, Hiroshi Shinotsuka, Hideki Yoshikawa	Efficient Removal of Noise-derived Components for Automatic XPS Spectral Decomposition Using Hierarchical Clustering	e-Journal of Surface Science and Nanotechnology	18	0	201	207	https://doi.org/10.1380/ejssnt.2020.201	2024-04-19 21:11:04 +0900
Paper	2020	2	Ryo Murakami, Hiromi Tanaka, Hiroshi Shinotsuka, Kenji Nagata, Hayaru Shouno, Hideki Yoshikawa	Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion	Journal of Electron Spectroscopy and Related Phenomena	245		147003		https://doi.org/10.1016/j.elspec.2020.147003	2024-04-19 21:11:04 +0900
Paper	2020	3	Mineharu Suzuki, Hiroko Nagao, Yoshitomo Harada, Hiroshi Shinotsuka, Katsumi Watanabe, Akito Sasaki, Asahiko Matsuda, Koji Kimoto, Hideki Yoshikawa	Raw-to-repository characterization data conversion for repeatable, replicable, and reproducible measurements	Journal of Vacuum Science & Technology A	38	2	023204		https://doi.org/10.1116/1.5128408	2024-04-19 21:11:04 +0900
Paper	2020	4	Hiroshi Shinotsuka, Hideki Yoshikawa, Ryo Murakami, Kazuki Nakamura, Hiromi Tanaka, Kazuhiro Yoshihara	Automated information compression of XPS spectrum using information criteria	Journal of Electron Spectroscopy and Related Phenomena	239		146903		https://doi.org/10.1016/j.elspec.2019.146903	2024-04-19 21:11:04 +0900
Paper	2020	5	Hiroshi Shinotsuka, Kenji Nagata, Hideki Yoshikawa, Yoh-Ichi Mototake, Hayaru Shouno, Masato Okada	Development of spectral decomposition based on Bayesian information criterion with estimation of confidence interval	Science and Technology of Advanced Materials	21	01	402	419	https://doi.org/10.1080/14686996.2020.1773210	2024-04-19 21:11:04 +0900
Paper	2019	1	Ryo Murakami, Hironori Kageyama, Kazuki Nakamura, Hiromi Tanaka, Hiroshi Shinotsuka, Hideki Yoshikawa, Kazuhiro Yoshihara	Background Estimation in X-ray Photoelectron Spectroscopy Data Using an Active Shirley Method with Automated Selection of the Analytical Range	e-Journal of Surface Science and Nanotechnology	17	0	61	68	https://doi.org/10.1380/ejssnt.2019.61	2024-04-19 21:11:04 +0900
Paper	2019	2	Bo Da, Hiroshi Shinotsuka, Hideki Yoshikawa, Shigeo Tanuma	NA	Surface and Interface Analysis	51	6	627	640	https://doi.org/10.1002/sia.6628	2024-04-19 21:11:04 +0900
Paper	2019	3	Hiroshi Shinotsuka, Shigeo Tanuma, Cedric J. Powell, Dave R. Penn	Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm	Surface and Interface Analysis	51	4	427	457	https://doi.org/10.1002/sia.6598	2024-04-19 21:11:04 +0900
Paper	2017	1	H Amekura, H Shinotsuka, H Yoshikawa	Are the triple surface plasmon resonances in Zn nanoparticles true?	Nanotechnology	28	49	495712		https://doi.org/10.1088/1361-6528/aa950d	2024-04-19 21:11:04 +0900
Paper	2017	2	H. Shinotsuka, B. Da, S. Tanuma, H. Yoshikawa, C. J. Powell, D. R. Penn	Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV	Surface and Interface Analysis	49	4	238	252	https://doi.org/10.1002/sia.6123	2024-04-19 21:11:04 +0900
Paper	2015	1	H. Shinotsuka, S. Tanuma, C. J. Powell, D. R. Penn	Calculations of electron inelastic mean free paths.  X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm	Surface and Interface Analysis	47	9	871	888	https://doi.org/10.1002/sia.5789	2024-04-19 21:11:04 +0900
Paper	2014	1	B. Da, H. Shinotsuka, H. Yoshikawa, Z. J. Ding, S. Tanuma	Extended Mermin Method for Calculating the Electron Inelastic Mean Free Path	Physical Review Letters	113	6			https://doi.org/10.1103/physrevlett.113.063201	2024-04-19 21:11:04 +0900
Paper	2013	1	H. Jin, H. Shinotsuka, H. Yoshikawa, H. Iwai, M. Arai, S. Tanuma, S. Tougaard	REELSから誘電関数を決定する因子分析法のロバスト性の評価	Surface and Interface Analysis	45	6	985	992	https://doi.org/10.1002/sia.5196	2024-04-19 21:11:04 +0900
Paper	2012	1	Kenji Yoshii, Ignace Jarrige, Chikashi Suzuki, Daiju Matsumura, Yasuo Nishihata, Yasuhiro Yoneda, Tatsuo Fukuda, Kazuhisa Tamura, Yoshiaki Ito, Takeshi Mukoyama, Tatsunori Tochio, Hiroshi Shinotsuka, Sei Fukushima	Probing the Ba 5d states in BaTiO3 and BaSO4: A resonant x-ray emission study at the Ba-L3 edge	Journal of Physics and Chemistry of Solids	73	9	1106	1110	https://doi.org/10.1016/j.jpcs.2012.04.009	2024-04-19 21:11:04 +0900
Paper	2012	2	H. Shinotsuka, S. Tanuma, C.J. Powell, D.R. Penn	Calculations of electron stopping powers for 41 elemental solids over the 50eV to 30keV range with the full Penn algorithm	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms	270		75	92	https://doi.org/10.1016/j.nimb.2011.09.016	2024-04-19 21:11:04 +0900
Paper	2011	1	Kenji Yoshii, Ignace Jarrige, Daiju Matsumura, Yasuo Nishihata, Chikashi Suzuki, Yoshiaki Ito, Takeshi Mukoyama, Tatsunori Tochio, Hiroshi Shinotsuka, Sei Fukushima	Resonant Inelastic X-ray Scattering at Ba-L$_{3}$ Edge in BaTiO$_{3}$	Japanese Journal of Applied Physics	50	9	09NE03		https://doi.org/10.1143/jjap.50.09ne03	2024-04-19 21:11:04 +0900
Paper	2010	1	Misato Kazama, Jun-ichi Adachi, Hiroshi Shinotsuka, Masakazu Yamazaki, Yusuke Ohori, Akira Yagishita, Takashi Fujikawa	Theoretical study of X-ray photoelectron diffraction for fixed-in-space CO molecules	Chemical Physics	373	3	261	266	https://doi.org/10.1016/j.chemphys.2010.04.038	2024-04-19 21:11:04 +0900
Paper	2010	2	H. Jin, H. Shinotsuka, H. Yoshikawa, H. Iwai, S. Tanuma, S. Tougaard	Measurement of optical constants of Si and SiO2 from reflection electron energy loss spectra using factor analysis method	Journal of Applied Physics	107	8	083709		https://doi.org/10.1063/1.3346345	2024-04-19 21:11:04 +0900
Paper	2010	3	H. Amekura, M. Tanaka, Y. Katsuya, H. Yoshikawa, H. Shinotsuka, S. Tanuma, M. Ohnuma, Y. Matsushita, K. Kobayashi, Ch. Buchal, S. Mantl, N. Kishimoto	Melting of Zn nanoparticles embedded in SiO2 at high temperatures: Effects on surface plasmon resonances	Applied Physics Letters	96	2	023110		https://doi.org/10.1063/1.3290984	2024-04-19 21:11:04 +0900