HOME > Profile > MITSUISHI, Kazutaka
- Field Director, Advanced Materials Characterization Field, Center for Basic Research on Materials
- Group Leader, In-situ Electron Microscopy Technique Group, Advanced Materials Characterization Field, Center for Basic Research on Materials
- Advanced Characterization Team, Center for Advanced Battery Collaboration, Research Center for Energy and Environmental Materials (GREEN)
- Materials Open Platform for All Solid-State Battery, External Collaboration Division
- Address
- 305-0047 1-2-1 Sengen Tsukuba Ibaraki JAPAN [Access]
PublicationsNIMS affiliated publications since 2004.
Research papers
- Ken Watanabe, Ayumu Tashiro, Yoshihiro Ichinose, Shinichi Takeno, Koichi Suematsu, Kazutaka Mitsuishi, Kengo Shimanoe. Lowering the sintering temperature of Li7La3Zr2O12 electrolyte for co-fired all-solid-state batteries via partial Bi substitution and precise control of compositional deviation. Journal of the Ceramic Society of Japan. 130 [7] (2022) 21183 10.2109/jcersj2.21183
- Kazutaka Mitsuishi, Katsuaki Nakazawa, Ryusuke Sagawa, Masahiko Shimizu, Hajime Matsumoto, Hisashi Shima, Takahiko Takewaki. Direct observation of Cu in high-silica chabazite zeolite by electron ptychography using Wigner distribution deconvolution. Scientific Reports. 13 [1] (2023) 316 10.1038/s41598-023-27452-3
- 土佐正弘, 後藤真宏, 笠原章, 三石和貴, 福田芳雄, 吉原一紘. 共蒸着SUS304鋼被膜表面への窒化ホウ素の偏析機構. 真空. ()
Books
- MITSUISHI, Kazutaka, ISHIZUKA, Kazuo. Multislice Method for STEM Image Simulation. Imperial College Press, 2014
- MITSUISHI, Kazutaka, TAKEGUCHI, Masaki. Scanning Confocal Electron Microscopy. Imperial College Press, 2014
- 木本 浩司, 三石 和貴, 三留 正則, 原 徹, 長井 拓郎. 物質・材料研究のための透過電子顕微鏡. 講談社, 2020, 400.
Proceedings
- MITSUISHI, Kazutaka, BEKAREVICH, Raman, TAKEGUCHI, Masaki, OHNISHI, Tsuyoshi, UESUGI, Fumihiko. Novel electron microscopy method for accurate measurements of the lattice constant changes in layered structures. Journal of Surface Analysis. (2019) 190-191
- Nobuhiro Ishikawa, Tadashi Mitsui, Masaki Takeguchi, Kazutaka Mitsuishi. In-situ observation of the interaction silicon and hematite. Journal of Surface Analysis. (2019) 144-145 10.1384/jsa.26.144
- Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo. Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope. Proceedings Microscopy & Microanalysis 2014. (2014) 376-377 10.1017/s1431927614003602
Presentations
- 三石 和貴. 4DSTEMによる電池材料の観察. 第9回 電池材料解析ワークショップ. 2022
- 三石 和貴, 中澤 克昭, 佐川隆亮. 電子線タイコグラフィーによる環境関連材料の観察. 第37回分析電子顕微鏡討論会. 2022
- TAKEGUCHI, Masaki, LI, Xiaoguang, MITSUISHI, Kazutaka. Transmission electron microscopy study of the dynamics of nanostructures in a carbon coated liquid cell. The 4th East-Asia Microscopy Conference. 2022
Misc
- MUROMACHI, Eiji, FUJITA, Takahiro, FUJITA, Daisuke, MURAKAWA, Kensaku, YAMAUCHI, Yasushi, MITSUISHI, Kazutaka, KAWAKITA, Mamiko, IWAI, Hideo, OHKUBO, Tadakatsu, KAWAKITA, Jin, KITAZAWA, Hideaki, KIMOTO, Koji, CUSTANCE, Oscar, KURAHASHI, Mitsunori, GOTO, Atsushi, SAKAGUCHI, Isao, SAKATA, Osami, SAKURAI, Kenji, ZHANG, Han, SHINOHARA, Tadashi, SHIMIZU, Tadashi, SHIMIZU, Tomoko, SHIWA, Mitsuharu, SUZUKI, Taku, SEKIGUCHI, Takashi, TANSHO, Masataka, CHIKYOW, Toyohiro, NAGATA, Takahiro, NOGUCHI, Hidenori, HASHI, Kenjiro, HONO, Kazuhiro, YAGYU, Shinjiro, YAMASHITA, Yoshiyuki, YOSHIKAWA, Genki, YOSHIKAWA, Hideki, YOSHITAKE, Michiko, WATANABE, Ken, WATANABE, Makoto. 材料イノベーションを加速する先進計測テクノロジーの現状と動向 物質・材料研究のための先進計測テクノロジー. 調査分析室レポートNIMS-RAO-FY2016-3 [ISBN] 978-4-9900563-7-7. 1 (2016) 42-51
- MUROMACHI, Eiji, FUJITA, Takahiro, FUJITA, Daisuke, MURAKAWA, Kensaku, YAMAUCHI, Yasushi, MITSUISHI, Kazutaka, KAWAKITA, Mamiko, IWAI, Hideo, OHKUBO, Tadakatsu, KAWAKITA, Jin, KITAZAWA, Hideaki, KIMOTO, Koji, CUSTANCE, Oscar, KURAHASHI, Mitsunori, GOTO, Atsushi, SAKAGUCHI, Isao, SAKATA, Osami, SAKURAI, Kenji, ZHANG, Han, SHINOHARA, Tadashi, SHIMIZU, Tadashi, SHIMIZU, Tomoko, SHIWA, Mitsuharu, SUZUKI, Taku, SEKIGUCHI, Takashi, TANSHO, Masataka, CHIKYOW, Toyohiro, NAGATA, Takahiro, NOGUCHI, Hidenori, HASHI, Kenjiro, HONO, Kazuhiro, YAGYU, Shinjiro, YAMASHITA, Yoshiyuki, YOSHIKAWA, Genki, YOSHIKAWA, Hideki, WATANABE, Ken, WATANABE, Makoto. 材料イノベーションを加速する先進計測テクノロジーの現状と動向. 調査分析室レポート. (2016) 73-89
- Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo. Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope. Microscopy and Microanalysis. 20 [S3] (2014) 376-377 10.1017/s1431927614003602
Patents
- No. 4735805 低エネルギーイオン照射による導電体物質からの特性X線発生方法とその装置 (2011)
- No. 4452811 低エネルギーイオン照射による絶縁体中の元素分析・評価方法 (2010)
- No. 7162833 半導体装置の製造方法 (2022)
- No: 2008226918 極微小ダイオード (2008)
- No: 2005111645 ナノ樹木状構造物とその作製方法 (2005)
- No: 2005247669 電子ビームを利用した鉄酸化物の製造方法 (2005)
Society memberships
Awards
- 日本顕微鏡学会「論文賞(顕微鏡基礎部門)(2010),日本顕微鏡学会 第7回奨励賞(2006),アメリカ材料学会秋季大会最優秀ポスター賞(1997) ()