HOME > Profile > MASUDA, Hideki
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- No longer at NIMS since March 2021
Research
- Keywords
走査型プローブ顕微鏡 走査型オージェ電子顕微鏡 超高真空表面分析 透過電子顕微鏡
PublicationsNIMS affiliated publications since 2004.
Research papers
- Hideki Masuda, Kyosuke Matsushita, Daigo Ito, Daisuke Fujita, Nobuyuki Ishida. Dynamically visualizing battery reactions by operando Kelvin probe force microscopy. Communications Chemistry. 2 [1] (2019) 10.1038/s42004-019-0245-x
- Hideki Masuda, Nobuyuki Ishida, Yoichiro Ogata, Daigo Ito, Daisuke Fujita. In situ visualization of Li concentration in all-solid-state lithium ion batteries using time-of-flight secondary ion mass spectrometry. Journal of Power Sources. 400 (2018) 527-532 10.1016/j.jpowsour.2018.08.040
- Hideki Masuda, Nobuyuki Ishida, Yoichiro Ogata, Daigo Ito, Daisuke Fujita. Internal potential mapping of charged solid-state-lithium ion batteries using in situ Kelvin probe force microscopy. Nanoscale. 9 [2] (2017) 893-898 10.1039/c6nr07971g
Books
- MASUDA, Hideki. Combined Transmission Electron Microscopy – In situ Observation of the Formation Process and Measurement of Physical Properties for Single Atomic-Sized Metallic Wires. Modern Electron Microscopy in Physical and Life Sciences. , 2016, 107-119.
Presentations
- ISHIDA, Nobuyuki, 伊藤 大悟, MASUDA, Hideki, FUJITA, Daisuke. Dynamic visualization of battery reactions by operando Kelvin probe force microscopy. The 4th international symposium on “Elucidation of Property of Next Generation Functional Materials and Surface/Interface”. 2019
- MASUDA, Hideki, ISHIDA, Nobuyuki, 伊藤 大悟, FUJITA, Daisuke. Operando visualization of electrical potential distributions in all-solid-state lithium ion battery using Kelvin probe force microscopy. The 10th Asian Conference on Electrochemical Power Sources 2019. 2019
- 石田 暢之, 増田 秀樹, 藤田 大介. 走査型プローブ顕微鏡による電位分布の動的観察： 全固体リチウムイオン電池の評価. NIMS先端計測シンポジウム2019. 2019
Misc
- 増田 秀樹. 真にナノスケールのインデンテーション試験による複合材料硬度測定法. まてりあ. 56 [1] (2017) 20-23 10.2320/materia.56.20
- 増田 秀樹, 石田 暢之, 小形曜一郎, 伊藤大悟, 藤田 大介. その場断面 KPFM 法を用いた全固体型リチウムイオン電池の内部電位計測. セラミックス. 52 [2] (2017) 96-99
- 増田 秀樹, グオ ホングゥアン, 藤田 大介. 【表彰】BNフラワーのHeイオン顕微鏡像. まてりあ. 54 [5] (2015) 204-204
Patents
- No. 6472014 飛行時間型二次イオン質量分析装置内電流電圧印加測定機構 (2019)
- No: 2016050769 飛行時間型二次イオン質量分析装置内電流電圧印加測定機構 (2016)
- No: 2017033889 試料載置ユニット、真空オペランド測定装置、及びリチウムイオン二次電池を用いたオペランド測定方法 (2017)
Society memberships
Awards
- NIMS WEEK Outstanding Poster Award (2016)
- NIMS Conference Outstanding Poster Award (2015)
- 日本金属学会金属組織写真賞奨励賞 (2014)
- ISSS-7 Best Poster Awards (2014)