publication_type	publication_year	number	author	title	journal_title	volume_number	issue_number	start_page	end_page	doi	reported_at
Paper	2026	1	Zhendong Wu, Tetsuya Tohei, Yusuke Hayashi, Shigeyoshi Usami, Masayuki Imanishi, Yusuke Mori, Junichi Takino, Kazushi Sumitani, Yasuhiko Imai, Shigeru Kimura, Akira Sakai, Zhendong Wu, Tetsuya Tohei, Shigeyoshi Usami, Masayuki Imanishi, Yusuke Mori, Junichi Takino, Kazushi Sumitani, Yasuhiko Imai, Shigeru Kimura, Akira Sakai	Uncovering crystal structure evolution via nanobeam X-ray diffraction with a continuity-driven machine learning approach	Materials & Design	263		115669	115669-12	https://doi.org/10.1016/j.matdes.2026.115669	2026-07-22 20:19:36 +0900
Paper	2025	1	Zhendong Wu, Yusuke Hayashi, Tetsuya Tohei, Kazushi Sumitani, Yasuhiko Imai, Shigeru Kimura, Akira Sakai, Zhendong Wu, Tetsuya Tohei, Kazushi Sumitani, Yasuhiko Imai, Shigeru Kimura, Akira Sakai	Machine learning assisted nanobeam X-ray diffraction based analysis on hydride vapor-phase epitaxy GaN	Journal of Applied Crystallography	58	4	S1600576725004169-1	S1600576725004169-15	https://doi.org/10.1107/s1600576725004169	2026-07-22 20:19:36 +0900
Paper	2025	2	Akihiro Shimada, Haruna Shiomi, Tetsuya Tohei, Yusuke Hayashi, Masaya Yamaguchi, Junpei Yamamoto, Takeaki Hamachi, Yasuhiko Imai, Kazushi Sumitani, Shigeru Kimura, Shota Kaneki, Tamotsu Hashizume, Akira Sakai, Akihiro Shimada, Haruna Shiomi, Tetsuya Tohei, Masaya Yamaguchi, Junpei Yamamoto, Takeaki Hamachi, Yasuhiko Imai, Kazushi Sumitani, Shigeru Kimura, Shota Kaneki, Tamotsu Hashizume, Akira Sakai	<i>In situ</i> nanobeam x-ray diffraction of local strain in AlGaN/GaN high-electron-mobility transistors under operating condition	Journal of Applied Physics	138	7	075701-1	075701-8	https://doi.org/10.1063/5.0275921	2026-07-22 20:19:36 +0900
Paper	2025	3	Akihiro Ohtake, Yusuke Hayashi	Controlled polarity inversion in GaAs/Ge/GaAs{111} heterostructures	Applied Physics Letters	126	20	201601-1	201601-6	https://doi.org/10.1063/5.0271426	2026-07-22 20:19:36 +0900
Paper	2025	4	Tomoyuki Horikawa, Yoshiyuki Tsusaka, Junji Matsui, Tetsuya Tohei, Yusuke Hayashi, Akira Sakai, Tomoyuki Horikawa, Yoshiyuki Tsusaka, Junji Matsui, Tetsuya Tohei, Akira Sakai	Analyses of oxygen precipitates in CZ-Si by X-ray diffuse scattering using parallel X-ray beam	Japanese Journal of Applied Physics	64	4	045502	045502-7	https://doi.org/10.35848/1347-4065/adc0d3	2026-07-22 20:19:36 +0900
Paper	2024	1	T. Hamachi, T. Tohei, Y. Hayashi, S. Usami, M. Imanishi, Y. Mori, K. Sumitani, Y. Imai, S. Kimura, A. Sakai	Analysis of local strain fields around individual threading dislocations in GaN substrates by nanobeam x-ray diffraction	Journal of Applied Physics	135	22	225702-1	225702-10	https://doi.org/10.1063/5.0199961	2026-07-22 20:19:36 +0900