publication_type	publication_year	number	author	title	journal_title	volume_number	issue_number	start_page	end_page	doi	reported_at
Misc	2017	1	P.A. Atanasov, N.N. Nedyalkov, Ru. Nikov, FUKATA, Naoki, JEVASUWAN, Wipakorn, SUBRAMANI, Thiyagu, D. Hirsch, B. Rauschenbach	SERS of insecticides and fungicides assisted by Au and Ag  nanostructures produced by laser techniques	International Journal of Environmental & Agriculture Research	3	4	61	69		2024-04-27 13:58:07 +0900
Misc	2010	1	SEKIGUCHI, Takashi, CHEN, Jun, TAKASE, Masami, FUKATA, Naoki, CHIKYOW, Toyohiro, Motoyuki Sato, Ryu Hasunuma, Kikuo Yamabe, Yasuo Nar	Electron-beam-induced current study of breakdown behavior of high-k gate MOSFETs	SOLID STATE PHENOMENA			461	466	https://doi.org/10.4028/www.scientific.net/156-158.461	2024-04-27 13:58:07 +0900
Misc	2008	1	CHEN, Jun, SEKIGUCHI, Takashi, TAKASE, Masami, FUKATA, Naoki, CHIKYOW, Toyohiro, Ryu Hasunuma, Kikuo Yamabe, Motoyuki Sato, Yasuo Nara, Keisaku Yamada	Electron-beam-induced current characterization of high-k dielectrics	Proc. of the 5th International Symposium on Advanced Science and Technology of Silicon Materials			74	77		2024-04-27 13:58:07 +0900
Misc	2008	2	CHEN, Jun, SEKIGUCHI, Takashi, FUKATA, Naoki, TAKASE, Masami, CHIKYOW, Toyohiro, Kikuo Yamabe, Ryu Hasunuma, Motoyuki Sato, Yasuo Nara, Keisaku Yamada	CHARACTERIZATION OF LEAKAGE BEHAVIORS OF HIGH-K GATE STACKS BY ELECTRON-BEAM-INDUCED CURRENT	IEEE IRPS 2008 Proceedings			584	588		2024-04-27 13:58:07 +0900
Misc	2007	1	深田直樹	Siナノ細線への熱酸化応力誘起とフォノン閉じ込め効果	応用物理学会結晶工学分科会第127回研究会テキスト			45	50		2024-04-27 13:58:07 +0900