publication_type	publication_year	number	author	title	journal_title	volume_number	issue_number	start_page	end_page	doi	reported_at
Misc	2013	1	CHEN, Jun, PRAKASH, Ronit Roneel, LI, Jian-Yong, JIPTNER, Karolin, MIYAMURA, Yoshiji, HARADA, Hirofumi, SEKIGUCHI, Takashi	An investigation of the impact of crystal orientation on dislocation distribution in multicrystalline silicon	Proceedings of 7th International Workshop on Crystalline Silicon Solar Cells 			138	141		2024-04-27 12:26:12 +0900
Misc	2012	1	Yoshiji Miyamura, Hirofumi Harada, Shun Ito, Jun Chen, Takashi Sekiguchi		Materials Science Forum	725		157	160	https://doi.org/10.4028/www.scientific.net/msf.725.157	2024-04-27 12:26:12 +0900
Misc	2010	1	SEKIGUCHI, Takashi, CHEN, Jun, TAKASE, Masami, FUKATA, Naoki, CHIKYOW, Toyohiro, Motoyuki Sato, Ryu Hasunuma, Kikuo Yamabe, Yasuo Nar	Electron-beam-induced current study of breakdown behavior of high-k gate MOSFETs	SOLID STATE PHENOMENA			461	466	https://doi.org/10.4028/www.scientific.net/156-158.461	2024-04-27 12:26:12 +0900
Misc	2008	1	CHEN, Jun, SEKIGUCHI, Takashi, TAKASE, Masami, FUKATA, Naoki, CHIKYOW, Toyohiro, Ryu Hasunuma, Kikuo Yamabe, Motoyuki Sato, Yasuo Nara, Keisaku Yamada	Electron-beam-induced current characterization of high-k dielectrics	Proc. of the 5th International Symposium on Advanced Science and Technology of Silicon Materials			74	77		2024-04-27 12:26:12 +0900
Misc	2008	2	CHEN, Jun, SEKIGUCHI, Takashi, FUKATA, Naoki, TAKASE, Masami, CHIKYOW, Toyohiro, Kikuo Yamabe, Ryu Hasunuma, Motoyuki Sato, Yasuo Nara, Keisaku Yamada	CHARACTERIZATION OF LEAKAGE BEHAVIORS OF HIGH-K GATE STACKS BY ELECTRON-BEAM-INDUCED CURRENT	IEEE IRPS 2008 Proceedings			584	588		2024-04-27 12:26:12 +0900
Misc	2008	3	SEKIGUCHI, Takashi, CHEN, Jun, CHEN, Bin, LEE, Woong	Electrical and optical activities of small-angle grain boundaries in multicrystalline silicon	Publication name Proc. of the 5th International Symposium on Advanced Science and Technology of Silicon Materials			140	143		2024-04-27 12:26:12 +0900
Misc	2008	4	CHEN, Bin, CHEN, Jun, SEKIGUCHI, Takashi, Takasumi Oyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura, FILIPPOFabbri	EBIC study of dislocations and stacking faults in 4H-SiC homoepitaxial films	Publication name Proc. of the 5th International Symposium on Advanced Science and Technology of Silicon Materials			299	303		2024-04-27 12:26:12 +0900
Misc	2004	1	謝栄国, SEKIGUCHI, Takashi, CHEN, Jun, 楊徳仁, 伊藤俊		Proc. of the 4th International Symposium on Advanced Science and Technology of Silicon Materials			424	428		2024-04-27 12:26:12 +0900