publication_type	publication_year	number	author	title	publication_title	doi	reported_at
Book	2018	1	陳 君, 関口 隆史				2024-05-02 06:18:50 +0900
Book	2016	1	SEKIGUCHI, Takashi, CHEN, Jun	Defect Characterization in Silicon by Electron-Beam-Induced Current and Cathodoluminescence Techniques	Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering		2024-05-02 06:18:50 +0900