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Analysis of distribution of critical current of bent-damaged Bi2223 composite tape
(曲げ損傷を受けたBi2223複合テープの臨界電流の分布解析)

S Ochiai, H Okuda, M Sugano, M Hojo, K Osamura, T Kuroda, H Kumakura, H Kitaguchi, K Itoh, H Wada.
IOP Conference Series: Materials Science and Engineering 152002-1-152002-4. 2011.
https://doi.org/10.1088/1757-899x/18/15/152002

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