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著者名Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Takaaki Mano, Fumihiko Uesugi, Masaki Takeguchi.
タイトルAccurate determination of strains at layered materials by selected area electron diffraction mapping
(Accurate determination of strains at layered materials by selected-area electron diffraction mapping)
発表誌名JAPANESE JOURNAL OF APPLIED PHYSICS
発表年2019
言語English
DOIhttps://doi.org/10.7567/1347-4065/ab19ac

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