SAMURAI - NIMS Researchers Database

HOME > Proceedings > Detail

Standardization of nanomaterials characterization by scanning probe microscopy for societal acceptance

FUJITA, Daisuke, ONISHI, Keiko, XU, Mingsheng.
JOURNAL OF PHYSICS：CONFERENCE SERIES 012002-1-012002-6. 2009.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2017-02-14 11:25:39 +0900Updated at: 2017-03-17 05:06:31 +0900

    ▲ Go to the top of this page