Impact of Cation Surface Termination on the Electrical Characteristics of HfO$_{2}$/InGaAs(001) Metal–Oxide–Semiconductor Capacitors
| 著者 | Akihiro Ohtake, Noriyuki Miyata, Yuji Urabe, Tetsuji Yasuda. |
|---|---|
| 発表誌名 | JAPANESE JOURNAL OF APPLIED PHYSICS |
| 発表年 | 2011 |
| 言語 | English |
| DOI | https://doi.org/10.1143/jjap.50.10pd01 |