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Nitrogen Incorporation in Hf-based High-k Dielectrics: Reduction in Electron Charge

UMEZAWA, Naoto, SHIRAISHI, Kenji, 鳥居和功, Mauro Boero, CHIKYOW, Toyohiro, WATANABE, Heiji, YAMABE, Kikuo, OHNO, Takahisa, YAMADA, Keisaku, 奈良安雄, YAMADA Keisaku.

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Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-27 00:53:57 +0900Updated at: 2017-03-17 02:54:25 +0900

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