HOME > Proceedings > DetailRecent Status of Thin Film Analyses by XPSIWAI, Hideo, John S. Hammond, TANUMA, Shigeo. JOURNAL OF SURFACE ANALYSIS 264-270. 2009.NIMS author(s)IWAI, HideoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 01:37:10 +0900Updated at: 2018-06-05 12:25:31 +0900