HOME > Proceedings > DetailOrigin of Large Contact Resistance in Organic Field-Effect Transistors(有機トランジスタにおける接触抵抗の起源)MINARI, Takeo, LIU, Chuan. Proceedings of the 2013 IEEE International Interconnect Technology Conference 145-147. 2013.NIMS author(s)MINARI, TakeoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 02:25:02 +0900Updated at: 2017-03-17 04:35:57 +0900