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X-ray absorption microspectroscopy with electrostatic force microscopy and its application to chemical states analyses of Si oxide nano structures
(静電気力顕微鏡を使ったX線吸収顕微分光とその酸化Siナノ構造の化学状態分析への応用)
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-27 01:13:48 +0900Updated at: 2017-03-17 03:13:10 +0900