HOME > Proceedings > DetailDetermination of band structures of InN/GaN interfaces by synchrotron radiation hard X-ray photoemission spectroscopyYasushi Toyoshima, Koji Horiba, Masaharu Oshima, Jitsuo Ohta, Hiroshi Fujioka, Hisayuki Miki, UEDA, Shigenori, YAMASHITA, Yoshiyuki, YOSHIKAWA, Hideki, KOBAYASHI, Keisuke. e-Journal of Surface Science and Nanotechnology 254-257. 2008.NIMS author(s)UEDA, ShigenoriYAMASHITA, YoshiyukiYOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 01:30:32 +0900Updated at: 2017-03-17 03:32:03 +0900