HOME > 会議録 > 書誌詳細Determination of band structures of InN/GaN interfaces by synchrotron radiation hard X-ray photoemission spectroscopyYasushi Toyoshima, Koji Horiba, Masaharu Oshima, Jitsuo Ohta, Hiroshi Fujioka, Hisayuki Miki, UEDA, Shigenori, YAMASHITA, Yoshiyuki, YOSHIKAWA, Hideki, KOBAYASHI, Keisuke. e-Journal of Surface Science and Nanotechnology 254-257. 2008.NIMS著者上田 茂典山下 良之吉川 英樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 01:30:32 +0900更新時刻: 2017-03-17 03:32:03 +0900
