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カンチレバーを用いた高分子薄膜のヤング率測定
(Youngs modulus of organic thin film measured by cantilever sensors.)


NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-27 01:23:04 +0900Updated at: 2017-03-17 03:23:27 +0900

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