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Utilization of Scanning SQUID Microscopy for Characterization of Superconducting Thin Films
(走査SQUID顕微鏡による超伝導薄膜評価法)

ARISAWA, Shunichi, YUN, Kyungsung, IGUCHI, Ienari, HATANO, Takeshi, Kazuhiro Endo, Tamio Endo.

NIMS author(s)


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    Created at :2017-02-27 02:23:47 +0900 Updated at :2017-03-17 04:34:27 +0900

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