HOME > Proceedings > DetailUtilization of Scanning SQUID Microscopy for Characterization of Superconducting Thin Films(走査SQUID顕微鏡による超伝導薄膜評価法)ARISAWA, Shunichi, YUN, Kyungsung, IGUCHI, Ienari, HATANO, Takeshi, Kazuhiro Endo, Tamio Endo. Proceedings of ICCE21, Tenerife 51-52. 2013.NIMS author(s)ARISAWA, ShunichiHATANO, TakeshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-02-27 02:23:47 +0900 Updated at :2017-03-17 04:34:27 +0900