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Utilization of Scanning SQUID Microscopy for Characterization of Superconducting Thin Films
(走査SQUID顕微鏡による超伝導薄膜評価法)


NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-27 02:23:47 +0900 Updated at: 2017-03-17 04:34:27 +0900

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