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Valence band structure of III-V nitride films characterized by hard X-ray photoelectron spectroscopy
(硬ｘ線光電子分光によるIII-V族窒化物薄膜の価電子帯構造評価)
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Created at: 2017-02-27 01:45:06 +0900Updated at: 2024-04-01 23:11:16 +0900