HOME > Presentation > Detail(Valence states of off-stoichiometric thin films based on the Heusler compound Co2MnSi)X. Kozina, S. Ouardi, G. Stryganyuk, B. Balke, S. Chadov, G. H. Fecher, C. Felser, T. Ishikawa, T. Uemura, M. Yamamoto, 池永英司, 山下 良之, 上田 茂典, 小林 啓介. HAXPES 2011. 2011.NIMS author(s)YAMASHITA, YoshiyukiUEDA, ShigenoriFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:53:15 +0900Updated at: 2017-07-10 21:08:03 +0900