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Point Defect Characterization in InGaN by Using Monoenergetic Positron Beams
12th Inter. Conf. on Atomically Contr. Surface, Interfaces & Nan. 2013.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:08:47 +0900Updated at: 2017-07-10 21:49:11 +0900