HOME > Presentation > Detail(Crystal Structure Analysis Using Annular Dark-Field Imaging with High Precision)木本 浩司, 石塚 和夫, 斎藤 光浩, 長井 拓郎, 于 秀珍, 解 栄軍, 廣崎 尚登, 松井 良夫. Microscopy & Microanalysis 2009. 2009.NIMS author(s)KIMOTO, KojiNAGAI, TakuroHIROSAKI, NaotoMATSUI, YoshioFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:25:32 +0900Updated at: 2017-07-10 20:33:12 +0900