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放射光硬X線光電子分光によるInN/GaN界面バンド構造の決定
(Determination of band structures of InN/GaN interfaces by synchrotron radiation hard X-ray photoemission spectroscopy)
春季第55回応用物理学会. March 27, 2008-March 30, 2008.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:24:44 +0900Updated at: 2017-07-10 20:09:43 +0900