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放射光軟X線顕微分光で探るグラフェンの異種接合界面電子状態
(Interface Physics in Graphene ~Spectromicroscopy Approach~)

第7回表面科学若手研究会. 2016-12-02. Invited

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-14 11:32:52 +0900Updated at: 2024-03-05 11:46:31 +0900

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