HOME > Presentation > Detail
Interface Characterization of Al/Co Laminated Film on a Si substrate using Variable Temperature TOF-SIMS
(温度可変TOF-SIMSによるSi/Al界面の評価)
SIP-IMASM 2015 1st Symposium . 2015.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-19 03:51:20 +0900Updated at: 2017-07-10 22:14:29 +0900