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Real-time in-situ machine learning analysis of RHEED images during MBE film growth

大澤 俊郎, 吉成 朝子, 安藤 康伸, 松村 太郎次郎, 小嗣 真人, NAGAMURA, Naoka.
15th International Symposium on Atomic Level Characterizations for New Materials and Devices '24 (ALC '24). November 17, 2024-November 22, 2024.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2024-12-04 03:17:43 +0900Updated at: 2024-12-04 03:17:43 +0900

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