HOME > Presentation > DetailCurrent pathway in the electrical measurements of platinum silicide nanowires using double-scanning-probe microscope久保 理, Do Kyung Lim, 新ヶ谷 義隆, Sehun Kim, 青野 正和, 中山 知信. International Conference on Nano Sci. and Technol. (ICN+T2007). 2007.NIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuNAKAYAMA, TomonobuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:17:05 +0900Updated at: 2017-07-10 19:55:18 +0900