HOME > Presentation > Detailひずみ測定のためのオパール薄膜の開発(Development of opal film for strain measurement)田中義和, 不動寺 浩, 百武壮. 秋季講演大会. 2016.NIMS author(s)FUDOUZI, HiroshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:05:33 +0900Updated at: 2017-07-10 22:27:21 +0900