HOME > 口頭発表 > 書誌詳細Analysis of Macro Defects in GaN Substrate Wafer based on Imaging Cathodoluminescence Technique CHEN, Jun, YI, Wei, Seiji HIGUCHI, SEKIGUCHI, Takashi. DRIP XVIII. 2019.NIMS著者陳 君イ ウェイMaterials Data Repository (MDR)上の本文・データセット作成時刻: 2019-09-20 03:00:21 +0900更新時刻: 2019-09-20 03:00:21 +0900