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Analysis of Macro Defects in GaN Substrate Wafer based on Imaging Cathodoluminescence Technique

CHEN, Jun, YI, Wei, Seiji HIGUCHI, SEKIGUCHI, Takashi.
DRIP XVIII. 2019.

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Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2019-09-20 03:00:21 +0900Updated at: 2019-09-20 03:00:21 +0900

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