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Evaluation of Al2O3 /n-, p-GaN samples by photothermal deflection spectroscopy

FUKUDA, Kiyotaka, ASAI, Yuya, SANG, Liwen, 吉越章隆, 尾沼猛儀, 山口智広, 本田徹, SUMIYA, Masatomo.
International workshop of nitride semiconductors 2018. 2018.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2019-03-04 10:08:58 +0900Updated at: 2019-03-04 10:08:58 +0900

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