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AuthorT.Watanabe, A.Uedono, S.Ishibashi, X.Q.Wang, S.T.Liu, G.Chen, SANG, Liwen, SUMIYA, Masatomo, B.Shen.
Title低速陽電子ビームを用いたInxGa1-xN混晶の空孔型欠陥の検出
Event name 第73回応用物理学会学術講演会
Year of publication2012
LanguageJapanese

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