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Analytical Transmission Electron Microscope using a Transition Edge Sensor for X-ray Microanalysis.

原 徹, 田中啓一, 前畑京介, 満田和久, 山中良浩, 日高睦夫.
17th International Workshop on Low Temperature Detectors . July 17, 2017-July 21, 2017. Invited

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    Created at: 2017-05-02 22:58:53 +0900Updated at: 2024-03-05 12:20:03 +0900

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