HOME > Presentation > Detail
Analytical Transmission Electron Microscope using a Transition Edge Sensor for X-ray Microanalysis.
17th International Workshop on Low Temperature Detectors . July 17, 2017-July 21, 2017. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-05-02 22:58:53 +0900Updated at: 2024-03-05 12:20:03 +0900