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Si基板上に直接成長させたGeのTOF-SIMS測定(II)
(TOF-SIMS measurement of Ge directly grown on Si substrate(II))
2014年 第75回応用物理学会秋季学術講演会. September 17, 2014-September 20, 2014.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:01:24 +0900Updated at: 2017-07-10 21:59:12 +0900