SAMURAI - NIMS Researchers Database

HOME > Presentation > Detail

電子線誘起電流(EBIC)法によるSi系材料の欠陥物性評価/粒界の電気的特性を中心として
(Characterization of Si-related materials by using Electron-Beam-Induced Current (EBIC) method)

2008年春季第55回応用物理学関係連合講演会. 2008. Invited

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at :2017-01-08 04:46:39 +0900 Updated at :2024-03-05 11:41:51 +0900

    ▲ Go to the top of this page