HOME > Presentation > DetailTrap-Related Carrier Transports in p-FET with Poly-Si/HfSiON Gate Stack 陳 君, 関口 隆史, 深田 直樹, 高瀬 雅美, 知京 豊裕, 蓮沼隆, 山部紀久夫, 佐藤基之, 奈良安雄, 山田啓作. The 2008 International Conference on Solid State Devices and Mat. 2008.NIMS author(s)CHEN, JunFUKATA, NaokiCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:23:12 +0900Updated at: 2017-07-10 20:15:57 +0900