HOME > Presentation > Detail
EBIC characterization of dislocation distribution in strained Si/SiGe
Invited
日本学術振興会第145委員会第101回研究会. 2004. NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:15:36 +0900Updated at: 2024-03-05 11:40:19 +0900