(EBIC and TEM Investigations of Current Leakage Sites in High-k Gate Stacks)
MANA International Symposium 2010. 2010.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-14 10:57:52 +0900更新時刻: 2017-07-10 20:45:11 +0900