HOME > Presentation > Detail(Low-temperature and in-field scanning Hall-probe microscopy for MgB2 wire characterization)K. Higashikawa, A. Yamamoto, L. He, K. Shiohara, K. Imamura, M. Inoue, T. Kiss, 松本 明善, 熊倉 浩明. ASC2012. 2012.NIMS author(s)MATSUMOTO, AkiyoshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:46:18 +0900Updated at: 2017-07-10 21:29:52 +0900