HOME > Presentation > DetailElectronic Structures under High-k Device Operation Investigated by Operando Hard X-ray Photoelectron Spectroscopy山下 良之, 吉川 英樹, 知京 豊裕, 小林 啓介. The 6th international conference on HAXPES. 2015.NIMS author(s)YAMASHITA, YoshiyukiYOSHIKAWA, HidekiCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 05:43:47 +0900Updated at: 2017-07-10 22:07:05 +0900