HOME > Presentation > DetailBias Dependent Electronic Structures under High-k Device Operation : Operando Hard X-ray Photoelectron Spectroscopy山下 良之. The Eleventh International Nanotechnology Conference on Communic. 2015.NIMS author(s)YAMASHITA, YoshiyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-02-14 11:43:35 +0900 Updated at :2017-07-10 22:09:11 +0900