HOME > Presentation > DetailAssesment of FIB induced damage by electron channeling contrast imagingグティエレス ウルティア イヴァン. 72th Meeting of the Japanese Microscopy Society. 2016.NIMS author(s)GUTIERREZ URRUTIA, IvanFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:51:50 +0900Updated at: 2017-07-10 22:26:51 +0900