HOME > Presentation > Detail噴水検出器による半導体・金属・絶縁体の二次電子観察(Secondary Electron Observation from Semiconductors/Metals/Insulators using Fountain Detector)関口 隆史, 岩井 秀夫, 揚村 寿英, 木村 隆. 日本顕微鏡学会第72回学術講演会. 2016.NIMS author(s)IWAI, HideoKIMURA, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-02-14 10:55:49 +0900 Updated at :2017-07-10 22:26:14 +0900