HOME > Presentation > DetailMultiple-scanning-probe microscope: a novel measurement tool of nanoscale signal transfer久保 理, 新ヶ谷 義隆, 青野 正和, 中山 知信. INC4. 2008.NIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuNAKAYAMA, TomonobuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:59:50 +0900Updated at: 2017-07-10 20:11:26 +0900