HOME > 口頭発表 > 書誌詳細Recent progress on the full filed deformation measurement in micro/nano-scale using grating techniquesHuimin Xie, KISHIMOTO, Satoshi, Anand Asundi, Fulong Dai. 4th International Conference on Experimental Mechanics 2009. 2009.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-14 11:24:04 +0900更新時刻: 2017-07-10 20:38:27 +0900